{"query":"kratos.com","mode":"domain","best":{"domain":"kratos.com","status":"valid","tier":"listed","authority":48,"verified":false,"title":"Kratos Analytical","summary":null,"country":"GB","country_source":"ip","publisher_country":null,"publisher_country_source":null,"hosting_country":"GB","llms_txt":"https://www.kratos.com/llms.txt","llms_full_txt":null,"last_checked":"2026-10-23T22:37:28.119Z","agent_terms":null,"categories":["science-research"],"capabilities":[],"inferred_tags":["xps","surface analysis","ion beam","analytical instruments","mass spectrometry"],"audience":"business","agent_uses":["read_docs","contact_support"],"language":"en","platform_generated":false,"agent_summary":"Kratos Analytical, maker of surface analysis instruments such as XPS systems and VCIS ion beam sources, with application notes and product pages.","llms_txt_cached":"https://agentwebmap.com/v1/domain/kratos.com/llms.txt","agentic":"documentation","section_keys":["application-notes","helpful-articles","pages","products","sitemaps"],"section_partial":false,"section_indexed_at":"2026-10-21T14:14:38.647Z","why":["authority 48 (listed)","checked 1043 minutes ago"]},"read":{"llms_txt":"https://www.kratos.com/llms.txt","llms_full_txt":null,"nested_llms_txt":[]},"terms":null,"health":{"ok":true,"status":"valid","tier":"listed","authority":48,"last_checked":"2026-10-23T22:37:28.119Z","checked_minutes_ago":1042,"stale":false,"max_age_seconds":86400,"live_checked":false,"http_status":200,"last_valid":"2026-10-23T22:37:28.119Z","content_hash":"97eaa053de1eb0d284be8f415430f7de","documentation_indexed_at":"2026-10-21T12:16:55.379Z"},"sources":[],"match":{"strength":"domain","reason":"Exact domain or its registered publisher."},"provenance":{"selection":"directory","reranked":false,"verification":"domain_ownership","terms":"unknown","excerpts":"publisher_link_metadata","health":"stored_crawl"},"alternatives":[]}